# K151564: Telio CAD Abutment Solutions

- Pathway: 510(k) (Abbreviated)
- Applicant: Ivoclar Vivadent, AG
- Decided: Sep 21, 2015 after 103 days
- Product code: NHA (Abutment, Implant, Dental, Endosseous)
- Device class: 2
- Regulation: 21 CFR 872.3630
- Recalls of this device: none
- Data: FDA decisions to Oct 25, 2026; recalls to Oct 12, 2026

## Lineage
Longest line of descent: 13 generations back to K894844 (1990). 178 ancestors in all.
1 later device descends from it; 1 cites it directly.
0 of 180 devices in its family (counting itself) have a Class I recall.

## Predicates on the family tree (from the FDA summary)
- K132209: Ips E.Max Cad Abutment Solutions, Ivoclar Vivadent, AG (2013) Summary page 5.
- K120822: Straumann Cares Variobase Abutment NNC, Straumann Cares Variobase Abutment RN, Straumann Cares Variobase Abutment WN, ST, Institut Straumann AG (2012) Summary page 5.
- K093708: Telio Cad, Ivoclar Vivadent, Inc. (2010) Summary page 5.

## Most influential descendants
- K193193: Telio CAD Abutment Solutions- extra systems (2020), 0 descendants of its own

## Indications for use
Telio CAD Abutment Solutions is intended for single hybrid abutment crowns for temporary restoration (up to 12 months). The system comprises three parts: - Telio CAD Abutment Solution - Ti base and - CAD/CAM software Telio CAD Abutment Solutions is cemented to the Ti base and used in conjunction with endosseous dental implants. The compatible implant system, CAD/CAM Systems and Ti bases arc shown below: Implant Systems: Straumann Bone Level Implant (K0530g8), Biomed 3i Certain (K014235) CAD/CAM System & Software: Sirona inLab and CEREC SW 4.2 and above (Kl00152 and K111421). Titanium bases (K100152 and K111421): Implant Manufacturer Implant System Implant Diameter TiBase Sirona Ref Interface Size Straumann Bone Level RC 4.1/4.8 S BL 4.1 6308337 L Biomct 3i Certain 3.4 BC 3.4 6308048 S Certain 4.1 BC 4.1 6308097 L Certain 5.0 DC 5.0 6308121 L

Source page: https://510kreport.com/device/K151564
Methodology: https://510kreport.com/methodology